While semiconductor design engineers become more aware of silent data corruption (SDC) or silent data errors (SDE) caused by aging, environmental factors, and other issues, embedded test solutions are emerging to address this subtle but critical challenge. One such solution applies embedded deterministic test patterns in-system via industry-standard APB or AXI bus interfaces.
Siemens EDA’s in-system test controller—designed specifically to work with the company’s Tessent Streaming Scan Network (SSN) software—performs deterministic testing throughout the silicon lifecycle. Tessent In-System Test is built on the success of Siemens’ Tessent MissionMode technology and Tessent SSN software.
Figure 1 The Tessent In-System Test software with embedded on-chip in-system test controller (ISTC) enables the test and diagnosis of semiconductor chips throughout the silicon lifecycle. Source: Siemens EDA
Tessent In-System Test enables seamless integration of deterministic test patterns generated with Siemens’ Tessent TestKompress software. That allows chip designers to apply embedded deterministic test patterns generated using Tessent TestKompress with Tessent SSN directly to the in-system test controller.
The resulting deterministic test patterns are applied in-system to provide the highest test quality level within a pre-defined test window. They also offer the ability to change test content as devices mature or age through the silicon lifecycle.
Figure 2 Tessent In-System Test applies high-quality deterministic test patterns for in-system/in-field testing during the lifecycle of a chip. Source: Siemens EDA
These in-system tests with embedded deterministic patterns also support the reuse of existing test infrastructure. They allow IC designers to reuse existing IJTAG- and SSN-based patterns for in-system applications while improving overall chip planning and reducing test time.
“Tessent In-System Test technology allows us to reuse our extensive test infrastructure and patterns already utilized in our manufacturing tests for our data center fleet,” said Dan Trock, senior DFT manager at Amazon Web Services (AWS). “This enables high-quality in-field testing of our data centers. Continuous monitoring of silicon devices throughout their lifecycle helps to ensure AWS customers benefit from infrastructure and services of the highest quality and reliability.”
The availability of solutions like the Tessent In-System Test shows that silent data corruption in ICs is now on designers’ radar and that more solutions are likely to emerge to counter this issue caused by aging and environmental factors.
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